文库 行业资料 AI

Machine Learning for High-Risk Applications_Patrick Hall, Rumman Chowdhury.pdf

AI PDF   112页   下载0   2026-01-26   浏览10   收藏0   点赞0   评分-   192653字   免费文档
温馨提示:当前文档最多只能预览 5 页,若文档总页数超出了 5 页,请下载原文档以浏览全部内容。
Machine Learning for High-Risk Applications_Patrick Hall, Rumman Chowdhury.pdf 第1页
Machine Learning for High-Risk Applications_Patrick Hall, Rumman Chowdhury.pdf 第2页
Machine Learning for High-Risk Applications_Patrick Hall, Rumman Chowdhury.pdf 第3页
剩余107页未读, 下载浏览全部
Machine Learning for High-Risk Applications FIRST EDITION Techniques for Responsible AI With Early Release ebooks, you get books in their earliest form—the author’s raw and unedited content as they write—so you can take advantage of these technologies long before the official release of these titles. Patrick Hall Machine Learning for High-Risk Applications by Patrick Hall Copyright © 2022 Patrick Hall. All rights reserved. Printed in the United States of America. Published by O’Reilly Media, Inc., 1005 Gravenstein Highway North, Sebastopol, CA 95472. O’Reilly books may be purchased for educational, business, or sales promotional use. Online editions are also available for most titles (http://oreilly.com). For more information, contact our corporate/institutional sales department: 800-998-9938 or [email protected]. Editors: Michele Cronin and Rebecca Novack Production Editor: Beth Kelly Copyeditor: FILL IN COPYEDITOR Proofreader: FILL IN PROOFREADER Indexer: FILL IN INDEXER Interior Designer: David Futato Cover Designer: Karen Montgomery Illustrator: Kate Dullea August 2022: First Edition Revision History for the Early Release 2021-05-26: First Release 2021-08-19: Second Release See http://oreilly.com/catalog/errata.csp?isbn=9781098102432 for release details. The O’Reilly logo is a registered trademark of O’Reilly Media, Inc. Machine Learning for High-Risk Applications, the cover image, and related trade dress are trademarks of O’Reilly Media, Inc. The views expressed in this work are those of the author, and do not represent the publisher’s views. While the publisher and the author have used good faith efforts to ensure that the information and instructions contained in this work are accurate, the publisher and the author disclaim all responsibility for errors or omissions, including without limitation responsibility for damages resulting from the use of or reliance on this work. Use of the information and instructions contained in this work is at your own ris
Machine Learning for High-Risk Applications_Patrick Hall, Rumman Chowdhury.pdf