Machine Learning for High-Risk
Applications
FIRST EDITION
Techniques for Responsible AI
With Early Release ebooks, you get books in their earliest form—the
author’s raw and unedited content as they write—so you can take
advantage of these technologies long before the official release of these
titles.
Patrick Hall
Machine Learning for High-Risk Applications
by Patrick Hall
Copyright © 2022 Patrick Hall. All rights reserved.
Printed in the United States of America.
Published by O’Reilly Media, Inc., 1005 Gravenstein Highway North,
Sebastopol, CA 95472.
O’Reilly books may be purchased for educational, business, or sales
promotional use. Online editions are also available for most titles
(http://oreilly.com). For more information, contact our
corporate/institutional sales department: 800-998-9938 or
[email protected].
Editors: Michele Cronin and Rebecca Novack
Production Editor: Beth Kelly
Copyeditor: FILL IN COPYEDITOR
Proofreader: FILL IN PROOFREADER
Indexer: FILL IN INDEXER
Interior Designer: David Futato
Cover Designer: Karen Montgomery
Illustrator: Kate Dullea
August 2022: First Edition
Revision History for the Early Release
2021-05-26: First Release
2021-08-19: Second Release
See http://oreilly.com/catalog/errata.csp?isbn=9781098102432 for release
details.
The O’Reilly logo is a registered trademark of O’Reilly Media, Inc.
Machine Learning for High-Risk Applications, the cover image, and related
trade dress are trademarks of O’Reilly Media, Inc.
The views expressed in this work are those of the author, and do not
represent the publisher’s views. While the publisher and the author have
used good faith efforts to ensure that the information and instructions
contained in this work are accurate, the publisher and the author disclaim all
responsibility for errors or omissions, including without limitation
responsibility for damages resulting from the use of or reliance on this
work. Use of the information and instructions contained in this work is at
your own ris
Machine Learning for High-Risk Applications_Patrick Hall, Rumman Chowdhury.pdf